APA (7th ed.) Citation

Tan, C. (2022). Editorial for Special Issue on Reliability Analysis of Electrotechnical Devices. Applied Sciences (2076-3417), 12(8), 4086. https://doi.org/10.3390/app12084086

Chicago Style (17th ed.) Citation

Tan, Cher-Ming. "Editorial for Special Issue on Reliability Analysis of Electrotechnical Devices." Applied Sciences (2076-3417) 12, no. 8 (2022): 4086. https://doi.org/10.3390/app12084086.

MLA (9th ed.) Citation

Tan, Cher-Ming. "Editorial for Special Issue on Reliability Analysis of Electrotechnical Devices." Applied Sciences (2076-3417), vol. 12, no. 8, 2022, p. 4086, https://doi.org/10.3390/app12084086.