Witzen, W. A., Polonsky, A. T., Rottmann, P. F., Pusch, K. M., Echlin, M. P., Pollock, T. M., & Beyerlein, I. J. (2022). Boundary characterization using 3D mapping of geometrically necessary dislocations in AM Ta microstructure. Journal of Materials Science, 57(21), 9885. https://doi.org/10.1007/s10853-022-07074-2
Chicago Style (17th ed.) CitationWitzen, Wyatt A., Andrew T. Polonsky, Paul F. Rottmann, Kira M. Pusch, McLean P. Echlin, Tresa M. Pollock, and Irene J. Beyerlein. "Boundary Characterization Using 3D Mapping of Geometrically Necessary Dislocations in AM Ta Microstructure." Journal of Materials Science 57, no. 21 (2022): 9885. https://doi.org/10.1007/s10853-022-07074-2.
MLA (9th ed.) CitationWitzen, Wyatt A., et al. "Boundary Characterization Using 3D Mapping of Geometrically Necessary Dislocations in AM Ta Microstructure." Journal of Materials Science, vol. 57, no. 21, 2022, p. 9885, https://doi.org/10.1007/s10853-022-07074-2.