APA (7th ed.) Citation

Huo, Y., Guan, D., & Li, X. (2022). In Situ Measurement Method Based on Edge Detection and Superpixel for Crystallization Imaging at High-Solid Concentrations. Crystals (2073-4352), 12(5), N.PAG. https://doi.org/10.3390/cryst12050730

Chicago Style (17th ed.) Citation

Huo, Yan, Diyuan Guan, and Xin Li. "In Situ Measurement Method Based on Edge Detection and Superpixel for Crystallization Imaging at High-Solid Concentrations." Crystals (2073-4352) 12, no. 5 (2022): N.PAG. https://doi.org/10.3390/cryst12050730.

MLA (9th ed.) Citation

Huo, Yan, et al. "In Situ Measurement Method Based on Edge Detection and Superpixel for Crystallization Imaging at High-Solid Concentrations." Crystals (2073-4352), vol. 12, no. 5, 2022, p. N.PAG, https://doi.org/10.3390/cryst12050730.