Oxygen crystallographic positions in thin films by non‐destructive resonant elastic X‐ray scattering. - Peña Corredor, Antonio; Wendling, Laurianne; Preziosi, Daniele; Schlur, Laurent; Leuvrey, Cédric; Thiaudière, Dominique; Elklaim, Erik; Blanc, Nils; Grenier, Stephane; Roulland, François; Viart, Nathalie; Lefevre, Christophe (Journal of Applied Crystallography, 2022)