Proximity-Induced Magnetism in a Topological Insulator/Half-Metallic Ferromagnetic Thin Film Heterostructure.
Saved in:
| Title: | Proximity-Induced Magnetism in a Topological Insulator/Half-Metallic Ferromagnetic Thin Film Heterostructure. |
|---|---|
| Authors: | Zhang, Min1, llg@126.comzmzmi1987@cwnu.edu.cn, Liu, Qiya2, liuqiya_xhsx@163.com, Liu, Ligang1, Zeng, Tixian3, zengtxnc@163.com |
| Source: | Coatings (2079-6412); Jun2022, Vol. 12 Issue 6, p750-N.PAG, 13p |
| Database: | Applied Science & Technology Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 20796412 |
|---|---|
| DOI: | 10.3390/coatings12060750 |