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Investigation and Modeling of the Electrical Bias Stress in Electrolyte‐Gated Organic Transistors.

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Title: Investigation and Modeling of the Electrical Bias Stress in Electrolyte‐Gated Organic Transistors.
Authors: Segantini, Matteo1, Ballesio, Alberto1, alberto.ballesio@polito.it, Palmara, Gianluca1, Zaccagnini, Pietro1, Frascella, Francesca1, Garzone, Giovanna1, Marasso, Simone Luigi1,2, Cocuzza, Matteo1,2, Parmeggiani, Matteo1
Source: Advanced Electronic Materials; Jul2022, Vol. 8 Issue 7, p1-17, 17p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 158066812
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Investigation and Modeling of the Electrical Bias Stress in Electrolyte‐Gated Organic Transistors.
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Electronic+Materials%22">Advanced Electronic Materials</searchLink>; Jul2022, Vol. 8 Issue 7, p1-17, 17p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=158066812
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        Value: 10.1002/aelm.202101332
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      – Code: eng
        Text: English
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        PageCount: 17
        StartPage: 1
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      – TitleFull: Investigation and Modeling of the Electrical Bias Stress in Electrolyte‐Gated Organic Transistors.
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            – D: 01
              M: 07
              Text: Jul2022
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              Y: 2022
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              Value: 7
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            – TitleFull: Advanced Electronic Materials
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