APA (7th ed.) Citation

Kumar, Y., Sharma, P., & Awana, V. P. S. (2022). Thickness-dependent magneto-transport of Bi2Se3/SiO2 topological insulator thin films. Journal of Materials Science: Materials in Electronics, 33(23), 18726. https://doi.org/10.1007/s10854-022-08720-w

Chicago Style (17th ed.) Citation

Kumar, Yogesh, Prince Sharma, and V. P. S. Awana. "Thickness-dependent Magneto-transport of Bi2Se3/SiO2 Topological Insulator Thin Films." Journal of Materials Science: Materials in Electronics 33, no. 23 (2022): 18726. https://doi.org/10.1007/s10854-022-08720-w.

MLA (9th ed.) Citation

Kumar, Yogesh, et al. "Thickness-dependent Magneto-transport of Bi2Se3/SiO2 Topological Insulator Thin Films." Journal of Materials Science: Materials in Electronics, vol. 33, no. 23, 2022, p. 18726, https://doi.org/10.1007/s10854-022-08720-w.