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Defect Engineering in MBE-Grown CdTe Buffer Layers on GaAs (211)B Substrates.

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Title: Defect Engineering in MBE-Grown CdTe Buffer Layers on GaAs (211)B Substrates.
Authors: Pan, W. W.1,2, Gu, R. J.1,2, Zhang, Z. K.1,2, Lei, W.1,2, wen.lei@uwa.edu.au, Umana-Membreno, G. A.1,2, Smith, D. J.3, Antoszewski, J.1,2, Faraone, L.1,2
Source: Journal of Electronic Materials; Sep2022, Vol. 51 Issue 9, p4869-4883, 15p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 158432096
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Defect Engineering in MBE-Grown CdTe Buffer Layers on GaAs (211)B Substrates.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Pan%2C+W%2E+W%2E%22">Pan, W. W.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Gu%2C+R%2E+J%2E%22">Gu, R. J.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Z%2E+K%2E%22">Zhang, Z. K.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lei%2C+W%2E%22">Lei, W.</searchLink><relatesTo>1,2</relatesTo>, <i>wen.lei@uwa.edu.au</i><br /><searchLink fieldCode="AU" term="%22Umana-Membreno%2C+G%2E+A%2E%22">Umana-Membreno, G. A.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Smith%2C+D%2E+J%2E%22">Smith, D. J.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Antoszewski%2C+J%2E%22">Antoszewski, J.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Faraone%2C+L%2E%22">Faraone, L.</searchLink><relatesTo>1,2</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Sep2022, Vol. 51 Issue 9, p4869-4883, 15p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=158432096
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s11664-022-09725-1
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 15
        StartPage: 4869
    Titles:
      – TitleFull: Defect Engineering in MBE-Grown CdTe Buffer Layers on GaAs (211)B Substrates.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Pan, W. W.
      – PersonEntity:
          Name:
            NameFull: Gu, R. J.
      – PersonEntity:
          Name:
            NameFull: Zhang, Z. K.
      – PersonEntity:
          Name:
            NameFull: Lei, W.
      – PersonEntity:
          Name:
            NameFull: Umana-Membreno, G. A.
      – PersonEntity:
          Name:
            NameFull: Smith, D. J.
      – PersonEntity:
          Name:
            NameFull: Antoszewski, J.
      – PersonEntity:
          Name:
            NameFull: Faraone, L.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 09
              Text: Sep2022
              Type: published
              Y: 2022
          Identifiers:
            – Type: issn-print
              Value: 03615235
          Numbering:
            – Type: volume
              Value: 51
            – Type: issue
              Value: 9
          Titles:
            – TitleFull: Journal of Electronic Materials
              Type: main
ResultId 1