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Monitoring of the recovery of ion-damaged 4H-SiC with in situ synchrotron X-ray diffraction as a tool for strain-engineering.

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Title: Monitoring of the recovery of ion-damaged 4H-SiC with in situ synchrotron X-ray diffraction as a tool for strain-engineering.
Authors: Chakravorty, Anusmita1, Boulle, Alexandre2, Debelle, Aurélien3, Monnet, Isabelle4, Manna, Gouranga5, Saha, Pinku6, Mukhopadhyay, Mrinmay Kumar7, Kabiraj, Debdulal1, kabiraj@iuac.res.in
Source: Journal of Materials Science; Nov2022, Vol. 57 Issue 43, p20309-20319, 11p, 1 Black and White Photograph, 5 Graphs
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 160295403
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Monitoring of the recovery of ion-damaged 4H-SiC with in situ synchrotron X-ray diffraction as a tool for strain-engineering.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%22">Journal of Materials Science</searchLink>; Nov2022, Vol. 57 Issue 43, p20309-20319, 11p, 1 Black and White Photograph, 5 Graphs
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=160295403
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s10853-022-07876-4
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 20309
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      – TitleFull: Monitoring of the recovery of ion-damaged 4H-SiC with in situ synchrotron X-ray diffraction as a tool for strain-engineering.
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            NameFull: Chakravorty, Anusmita
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            NameFull: Boulle, Alexandre
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            NameFull: Debelle, Aurélien
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            NameFull: Manna, Gouranga
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            NameFull: Mukhopadhyay, Mrinmay Kumar
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              Text: Nov2022
              Type: published
              Y: 2022
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              Value: 57
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              Value: 43
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            – TitleFull: Journal of Materials Science
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