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Cost–Benefit Analysis of Scan-vs-BIM-Based Quality Management.

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Bibliographic Details
Title: Cost–Benefit Analysis of Scan-vs-BIM-Based Quality Management.
Authors: Kim, Taewan1, Yoon, Youngjoon1, yjoon007@hanyang.ac.kr, Lee, Byeongdo2, Ham, Namhyuk3, Kim, Jae-Jun1
Source: Buildings (2075-5309); Dec2022, Vol. 12 Issue 12, p2052, 21p
Database: Applied Science & Technology Source
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Description
ISSN:20755309
DOI:10.3390/buildings12122052