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Cost–Benefit Analysis of Scan-vs-BIM-Based Quality Management.

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Title: Cost–Benefit Analysis of Scan-vs-BIM-Based Quality Management.
Authors: Kim, Taewan1, Yoon, Youngjoon1, yjoon007@hanyang.ac.kr, Lee, Byeongdo2, Ham, Namhyuk3, Kim, Jae-Jun1
Source: Buildings (2075-5309); Dec2022, Vol. 12 Issue 12, p2052, 21p
Database: Applied Science & Technology Source
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Header DbId: aci
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PubType: Academic Journal
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  Data: <searchLink fieldCode="JN" term="%22Buildings+%282075-5309%29%22">Buildings (2075-5309)</searchLink>; Dec2022, Vol. 12 Issue 12, p2052, 21p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=160941181
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        Value: 10.3390/buildings12122052
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      – Code: eng
        Text: English
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            NameFull: Kim, Taewan
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            NameFull: Lee, Byeongdo
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              Text: Dec2022
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              Y: 2022
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