APA (7th ed.) Citation

Yu, J., & Zhang, Y. (2023). Challenges and opportunities of deep learning-based process fault detection and diagnosis: A review. Neural Computing & Applications, 35(1), 211. https://doi.org/10.1007/s00521-022-08017-3

Chicago Style (17th ed.) Citation

Yu, Jianbo, and Yue Zhang. "Challenges and Opportunities of Deep Learning-based Process Fault Detection and Diagnosis: A Review." Neural Computing & Applications 35, no. 1 (2023): 211. https://doi.org/10.1007/s00521-022-08017-3.

MLA (9th ed.) Citation

Yu, Jianbo, and Yue Zhang. "Challenges and Opportunities of Deep Learning-based Process Fault Detection and Diagnosis: A Review." Neural Computing & Applications, vol. 35, no. 1, 2023, p. 211, https://doi.org/10.1007/s00521-022-08017-3.