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Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range.

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Title: Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range.
Authors: Bengi, Seda1, sbengi@baskent.edu.tr, Yükseltürk, Esra2, Bülbül, M. Mahir3
Source: Journal of Materials Science: Materials in Electronics; Jan2023, Vol. 34 Issue 3, p1-9, 9p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 161418805
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Bengi%2C+Seda%22">Bengi, Seda</searchLink><relatesTo>1</relatesTo>, <i>sbengi@baskent.edu.tr</i><br /><searchLink fieldCode="AU" term="%22Yükseltürk%2C+Esra%22">Yükseltürk, Esra</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Bülbül%2C+M%2E+Mahir%22">Bülbül, M. Mahir</searchLink><relatesTo>3</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jan2023, Vol. 34 Issue 3, p1-9, 9p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=161418805
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10854-022-09613-8
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 9
        StartPage: 1
    Titles:
      – TitleFull: Investigation of electrical characterization of Al/HfO2/p-Si structures in wide temperature range.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Bengi, Seda
      – PersonEntity:
          Name:
            NameFull: Yükseltürk, Esra
      – PersonEntity:
          Name:
            NameFull: Bülbül, M. Mahir
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 20
              M: 01
              Text: Jan2023
              Type: published
              Y: 2023
          Identifiers:
            – Type: issn-print
              Value: 09574522
          Numbering:
            – Type: volume
              Value: 34
            – Type: issue
              Value: 3
          Titles:
            – TitleFull: Journal of Materials Science: Materials in Electronics
              Type: main
ResultId 1