APA (7th ed.) Citation

Stoschka, M., Horvath, M., Fladischer, S., & Oberreiter, M. (2023). Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency. Applied Sciences (2076-3417), 13(4), 2247. https://doi.org/10.3390/app13042247

Chicago Style (17th ed.) Citation

Stoschka, Michael, Michael Horvath, Stefan Fladischer, and Matthias Oberreiter. "Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency." Applied Sciences (2076-3417) 13, no. 4 (2023): 2247. https://doi.org/10.3390/app13042247.

MLA (9th ed.) Citation

Stoschka, Michael, et al. "Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency." Applied Sciences (2076-3417), vol. 13, no. 4, 2023, p. 2247, https://doi.org/10.3390/app13042247.