Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency.
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| Title: | Study of Local Fatigue Methods (TCD, N-SIF, and ESED) on Notches and Defects Related to Numerical Efficiency. |
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| Authors: | Stoschka, Michael1, michael.stoschka@unileoben.ac.at, Horvath, Michael1, Fladischer, Stefan2, Oberreiter, Matthias1 |
| Source: | Applied Sciences (2076-3417); Feb2023, Vol. 13 Issue 4, p2247, 41p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 20763417 |
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| DOI: | 10.3390/app13042247 |
