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Describing mechanical damage evolution through in situ electrical resistance measurements.

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Title: Describing mechanical damage evolution through in situ electrical resistance measurements.
Authors: Gebhart, David D.1, david.gebhart@oeaw.ac.at, Krapf, Anna2, Merle, Benoit3, Gammer, Christoph1, Cordill, Megan J.1
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Mar2023, Vol. 41 Issue 2, p1-8, 8p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 162235981
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=162235981
RecordInfo BibRecord:
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    Identifiers:
      – Type: doi
        Value: 10.1116/6.0002362
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      – Code: eng
        Text: English
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        PageCount: 8
        StartPage: 1
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      – TitleFull: Describing mechanical damage evolution through in situ electrical resistance measurements.
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            NameFull: Gebhart, David D.
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            NameFull: Krapf, Anna
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            NameFull: Merle, Benoit
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            NameFull: Gammer, Christoph
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            NameFull: Cordill, Megan J.
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          Dates:
            – D: 01
              M: 03
              Text: Mar2023
              Type: published
              Y: 2023
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              Value: 07342101
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              Value: 41
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            – TitleFull: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
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