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Describing mechanical damage evolution through in situ electrical resistance measurements.

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Bibliographic Details
Title: Describing mechanical damage evolution through in situ electrical resistance measurements.
Authors: Gebhart, David D.1, david.gebhart@oeaw.ac.at, Krapf, Anna2, Merle, Benoit3, Gammer, Christoph1, Cordill, Megan J.1
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Mar2023, Vol. 41 Issue 2, p1-8, 8p
Database: Applied Science & Technology Source
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