KIM, J., FELDT, R., & YOO, S. (2023). Evaluating Surprise Adequacy for Deep Learning System Testing. ACM Transactions on Software Engineering & Methodology, 32(2), 1. https://doi.org/10.1145/3546947
Chicago Style (17th ed.) CitationKIM, JINHAN, ROBERT FELDT, and SHIN YOO. "Evaluating Surprise Adequacy for Deep Learning System Testing." ACM Transactions on Software Engineering & Methodology 32, no. 2 (2023): 1. https://doi.org/10.1145/3546947.
MLA (9th ed.) CitationKIM, JINHAN, et al. "Evaluating Surprise Adequacy for Deep Learning System Testing." ACM Transactions on Software Engineering & Methodology, vol. 32, no. 2, 2023, p. 1, https://doi.org/10.1145/3546947.
Warning: These citations may not always be 100% accurate.
