Evaluating Surprise Adequacy for Deep Learning System Testing.

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Bibliographic Details
Title: Evaluating Surprise Adequacy for Deep Learning System Testing.
Authors: JINHAN KIM1, jinhankim@kaist.ac.kr, FELDT, ROBERT2, shin.yoo@kaist.ac.kr, SHIN YOO1, robert.feldt@chalmers.se
Source: ACM Transactions on Software Engineering & Methodology; Mar2023, Vol. 32 Issue 2, p1-29, 29p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 163051926
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PubType: Academic Journal
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  Data: Evaluating Surprise Adequacy for Deep Learning System Testing.
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      – Type: doi
        Value: 10.1145/3546947
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      – Code: eng
        Text: English
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        PageCount: 29
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      – TitleFull: Evaluating Surprise Adequacy for Deep Learning System Testing.
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            NameFull: JINHAN KIM
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              Text: Mar2023
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              Y: 2023
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