Vuillermet, E., Bercu, N., Etienne, F., & Lazar, M. (2023). Cathodoluminescence Characterization of Point Defects Generated through Ion Implantations in 4H-SiC. Coatings (2079-6412), 13(6), 992. https://doi.org/10.3390/coatings13060992
Chicago Style (17th ed.) CitationVuillermet, Enora, Nicolas Bercu, Florence Etienne, and Mihai Lazar. "Cathodoluminescence Characterization of Point Defects Generated Through Ion Implantations in 4H-SiC." Coatings (2079-6412) 13, no. 6 (2023): 992. https://doi.org/10.3390/coatings13060992.
MLA (9th ed.) CitationVuillermet, Enora, et al. "Cathodoluminescence Characterization of Point Defects Generated Through Ion Implantations in 4H-SiC." Coatings (2079-6412), vol. 13, no. 6, 2023, p. 992, https://doi.org/10.3390/coatings13060992.