APA (7th ed.) Citation

Pandey, A., Bhattacharya, S., Panigrahi, J., Mandal, S., & Komarala, V. K. (2023). Investigation of anisotropic textured crystalline silicon surface passivation with intrinsic amorphous silicon layers: Role of annealing pressure conditions during passivation recovery. Journal of Materials Science: Materials in Electronics, 34(21), 1. https://doi.org/10.1007/s10854-023-10986-7

Chicago Style (17th ed.) Citation

Pandey, Ashutosh, Shrestha Bhattacharya, Jagannath Panigrahi, Sourav Mandal, and Vamsi Krishna Komarala. "Investigation of Anisotropic Textured Crystalline Silicon Surface Passivation with Intrinsic Amorphous Silicon Layers: Role of Annealing Pressure Conditions During Passivation Recovery." Journal of Materials Science: Materials in Electronics 34, no. 21 (2023): 1. https://doi.org/10.1007/s10854-023-10986-7.

MLA (9th ed.) Citation

Pandey, Ashutosh, et al. "Investigation of Anisotropic Textured Crystalline Silicon Surface Passivation with Intrinsic Amorphous Silicon Layers: Role of Annealing Pressure Conditions During Passivation Recovery." Journal of Materials Science: Materials in Electronics, vol. 34, no. 21, 2023, p. 1, https://doi.org/10.1007/s10854-023-10986-7.