Investigation of anisotropic textured crystalline silicon surface passivation with intrinsic amorphous silicon layers: role of annealing pressure conditions during passivation recovery.

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Title: Investigation of anisotropic textured crystalline silicon surface passivation with intrinsic amorphous silicon layers: role of annealing pressure conditions during passivation recovery.
Authors: Pandey, Ashutosh1, Bhattacharya, Shrestha1, Panigrahi, Jagannath1, Mandal, Sourav1, Komarala, Vamsi Krishna1, vamsi@iitd.ac.in
Source: Journal of Materials Science: Materials in Electronics; Jul2023, Vol. 34 Issue 21, p1-11, 11p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 167345598
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  Data: Investigation of anisotropic textured crystalline silicon surface passivation with intrinsic amorphous silicon layers: role of annealing pressure conditions during passivation recovery.
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  Data: <searchLink fieldCode="AU" term="%22Pandey%2C+Ashutosh%22">Pandey, Ashutosh</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Bhattacharya%2C+Shrestha%22">Bhattacharya, Shrestha</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Panigrahi%2C+Jagannath%22">Panigrahi, Jagannath</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Mandal%2C+Sourav%22">Mandal, Sourav</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Komarala%2C+Vamsi+Krishna%22">Komarala, Vamsi Krishna</searchLink><relatesTo>1</relatesTo>, <i>vamsi@iitd.ac.in</i>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jul2023, Vol. 34 Issue 21, p1-11, 11p
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RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1007/s10854-023-10986-7
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 1
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      – TitleFull: Investigation of anisotropic textured crystalline silicon surface passivation with intrinsic amorphous silicon layers: role of annealing pressure conditions during passivation recovery.
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            NameFull: Pandey, Ashutosh
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            NameFull: Bhattacharya, Shrestha
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            NameFull: Panigrahi, Jagannath
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            NameFull: Mandal, Sourav
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            NameFull: Komarala, Vamsi Krishna
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            – D: 21
              M: 07
              Text: Jul2023
              Type: published
              Y: 2023
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              Value: 34
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              Value: 21
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            – TitleFull: Journal of Materials Science: Materials in Electronics
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