View in EDS HTML Full Text PDF Full Text

Reliability analysis of random vibration for a CCGA624 component based on an improved Miner’s rule.

Saved in:
Bibliographic Details
Title: Reliability analysis of random vibration for a CCGA624 component based on an improved Miner’s rule.
Authors: Qi, Lin1, Xu, Weiling1, Yu, Jianghao2, Liu, Qiang1, Xie, Danfeng1, Wu, Yanwei1, Yang, Ruidong1, Zhang, Jingzhao1, Zhang, Hefeng3, Li, Hailong2, dragoneptech@163.com
Source: Journal of Materials Science: Materials in Electronics; Dec2023, Vol. 34 Issue 36, p1-12, 12p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
FullText Links:
  – Type: pdflink
Text:
  Availability: 1
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 174308177
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Reliability analysis of random vibration for a CCGA624 component based on an improved Miner’s rule.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Qi%2C+Lin%22">Qi, Lin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Xu%2C+Weiling%22">Xu, Weiling</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yu%2C+Jianghao%22">Yu, Jianghao</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Qiang%22">Liu, Qiang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Xie%2C+Danfeng%22">Xie, Danfeng</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wu%2C+Yanwei%22">Wu, Yanwei</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Yang%2C+Ruidong%22">Yang, Ruidong</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Jingzhao%22">Zhang, Jingzhao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Hefeng%22">Zhang, Hefeng</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Hailong%22">Li, Hailong</searchLink><relatesTo>2</relatesTo>, <i>dragoneptech@163.com</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Dec2023, Vol. 34 Issue 36, p1-12, 12p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=174308177
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10854-023-11743-6
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 12
        StartPage: 1
    Titles:
      – TitleFull: Reliability analysis of random vibration for a CCGA624 component based on an improved Miner’s rule.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Qi, Lin
      – PersonEntity:
          Name:
            NameFull: Xu, Weiling
      – PersonEntity:
          Name:
            NameFull: Yu, Jianghao
      – PersonEntity:
          Name:
            NameFull: Liu, Qiang
      – PersonEntity:
          Name:
            NameFull: Xie, Danfeng
      – PersonEntity:
          Name:
            NameFull: Wu, Yanwei
      – PersonEntity:
          Name:
            NameFull: Yang, Ruidong
      – PersonEntity:
          Name:
            NameFull: Zhang, Jingzhao
      – PersonEntity:
          Name:
            NameFull: Zhang, Hefeng
      – PersonEntity:
          Name:
            NameFull: Li, Hailong
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 21
              M: 12
              Text: Dec2023
              Type: published
              Y: 2023
          Identifiers:
            – Type: issn-print
              Value: 09574522
          Numbering:
            – Type: volume
              Value: 34
            – Type: issue
              Value: 36
          Titles:
            – TitleFull: Journal of Materials Science: Materials in Electronics
              Type: main
ResultId 1