APA (7th ed.) Citation

Wan, D., Gao, C., Zhou, J., Shen, X., & Shen, L. (2024). Unsupervised fabric defect detection with high-frequency feature mapping. Multimedia Tools & Applications, 83(7), 21615. https://doi.org/10.1007/s11042-023-16340-7

Chicago Style (17th ed.) Citation

Wan, Da, Can Gao, Jie Zhou, Xinrui Shen, and Linlin Shen. "Unsupervised Fabric Defect Detection with High-frequency Feature Mapping." Multimedia Tools & Applications 83, no. 7 (2024): 21615. https://doi.org/10.1007/s11042-023-16340-7.

MLA (9th ed.) Citation

Wan, Da, et al. "Unsupervised Fabric Defect Detection with High-frequency Feature Mapping." Multimedia Tools & Applications, vol. 83, no. 7, 2024, p. 21615, https://doi.org/10.1007/s11042-023-16340-7.