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Unsupervised fabric defect detection with high-frequency feature mapping.

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Bibliographic Details
Title: Unsupervised fabric defect detection with high-frequency feature mapping.
Authors: Wan, Da1,2,3, Gao, Can1,2,3, 2005gaocan@163.com, Zhou, Jie1,2,3, Shen, Xinrui4, Shen, Linlin1,2,3
Source: Multimedia Tools & Applications; Feb2024, Vol. 83 Issue 7, p21615-21632, 18p
Database: Applied Science & Technology Source
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Description
ISSN:13807501
DOI:10.1007/s11042-023-16340-7