Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm.
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| Title: | Reliable ferroelectricity in sol–gel‐derived BiFeO3 thin films below 200 nm. |
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| Authors: | Gao, Xuan1, Dai, Le1, Liu, Yang1, Wang, Ke2, Karpinsky, D. V.3, Liu, Lisha1, lishaliu@njust.edu.cn, Wang, Yaojin1, yjwang@njust.edu.cn |
| Source: | Journal of the American Ceramic Society; May2024, Vol. 107 Issue 5, p3301-3312, 12p |
| Database: | Applied Science & Technology Source |
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