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Structure and defect analysis of different polysilazane‐derived silicon carbide systems.

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Title: Structure and defect analysis of different polysilazane‐derived silicon carbide systems.
Authors: Shuster, Seth1, Bamonte, Scott2, Valus, Joseph1, Purgay, Ryan1, Arif, Fayaz3, March, Seth4, Suib, Steven L.5, steven.suib@uconn.edu
Source: Journal of the American Ceramic Society; Jun2024, Vol. 107 Issue 6, p4296-4306, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 176353358
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Structure and defect analysis of different polysilazane‐derived silicon carbide systems.
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+the+American+Ceramic+Society%22">Journal of the American Ceramic Society</searchLink>; Jun2024, Vol. 107 Issue 6, p4296-4306, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=176353358
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1111/jace.19703
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      – Code: eng
        Text: English
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        PageCount: 11
        StartPage: 4296
    Titles:
      – TitleFull: Structure and defect analysis of different polysilazane‐derived silicon carbide systems.
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            NameFull: Shuster, Seth
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            NameFull: Bamonte, Scott
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            NameFull: Valus, Joseph
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            NameFull: Purgay, Ryan
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            NameFull: Arif, Fayaz
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            NameFull: March, Seth
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            NameFull: Suib, Steven L.
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            – D: 01
              M: 06
              Text: Jun2024
              Type: published
              Y: 2024
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              Value: 107
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            – TitleFull: Journal of the American Ceramic Society
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