APA (7th ed.) Citation

Rouf, A., Park, S. H., & Singer, J. P. (2024). Sub‐Micron Thickness Self‐Limiting Electrospray Deposition via Voltage Bias of Spray Target. Advanced Materials Interfaces, 11(12), 1. https://doi.org/10.1002/admi.202300982

Chicago Style (17th ed.) Citation

Rouf, Ayman, Sarah H. Park, and Jonathan P. Singer. "Sub‐Micron Thickness Self‐Limiting Electrospray Deposition via Voltage Bias of Spray Target." Advanced Materials Interfaces 11, no. 12 (2024): 1. https://doi.org/10.1002/admi.202300982.

MLA (9th ed.) Citation

Rouf, Ayman, et al. "Sub‐Micron Thickness Self‐Limiting Electrospray Deposition via Voltage Bias of Spray Target." Advanced Materials Interfaces, vol. 11, no. 12, 2024, p. 1, https://doi.org/10.1002/admi.202300982.