Cui, J., Li, X., Zhang, X., Huang, S., & Feng, Y. (2024). Electronic explosives inspection: A fine-grained X-ray benchmark and few-shot prohibited phone detection model. Multimedia Tools & Applications, 83(16), 47919. https://doi.org/10.1007/s11042-023-17388-1
Chicago Style (17th ed.) CitationCui, Jianzhao, Xiongfei Li, Xiaoli Zhang, Sa Huang, and Yuncong Feng. "Electronic Explosives Inspection: A Fine-grained X-ray Benchmark and Few-shot Prohibited Phone Detection Model." Multimedia Tools & Applications 83, no. 16 (2024): 47919. https://doi.org/10.1007/s11042-023-17388-1.
MLA (9th ed.) CitationCui, Jianzhao, et al. "Electronic Explosives Inspection: A Fine-grained X-ray Benchmark and Few-shot Prohibited Phone Detection Model." Multimedia Tools & Applications, vol. 83, no. 16, 2024, p. 47919, https://doi.org/10.1007/s11042-023-17388-1.