APA (7th ed.) Citation

Cheung, S. H., Schmidt, K., Baribeau, J., Lockwood, D. J., & O’Leary, S. K. (2024). A re-examination of thin-film silicon’s Raman spectrum. Journal of Materials Science: Materials in Electronics, 35(13), 1. https://doi.org/10.1007/s10854-024-12616-2

Chicago Style (17th ed.) Citation

Cheung, Sin Hang, Kathrin Schmidt, Jean-Marc Baribeau, David J. Lockwood, and Stephen K. O’Leary. "A Re-examination of Thin-film Silicon’s Raman Spectrum." Journal of Materials Science: Materials in Electronics 35, no. 13 (2024): 1. https://doi.org/10.1007/s10854-024-12616-2.

MLA (9th ed.) Citation

Cheung, Sin Hang, et al. "A Re-examination of Thin-film Silicon’s Raman Spectrum." Journal of Materials Science: Materials in Electronics, vol. 35, no. 13, 2024, p. 1, https://doi.org/10.1007/s10854-024-12616-2.