A re-examination of thin-film silicon’s Raman spectrum.
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| Title: | A re-examination of thin-film silicon’s Raman spectrum. |
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| Authors: | Cheung, Sin Hang1, Schmidt, Kathrin1, Baribeau, Jean-Marc2, Lockwood, David J.3, O’Leary, Stephen K.1, stephen.oleary@ubc.ca |
| Source: | Journal of Materials Science: Materials in Electronics; May2024, Vol. 35 Issue 13, p1-18, 18p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 09574522 |
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| DOI: | 10.1007/s10854-024-12616-2 |
