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A re-examination of thin-film silicon’s Raman spectrum.

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Title: A re-examination of thin-film silicon’s Raman spectrum.
Authors: Cheung, Sin Hang1, Schmidt, Kathrin1, Baribeau, Jean-Marc2, Lockwood, David J.3, O’Leary, Stephen K.1, stephen.oleary@ubc.ca
Source: Journal of Materials Science: Materials in Electronics; May2024, Vol. 35 Issue 13, p1-18, 18p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 177097871
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: A re-examination of thin-film silicon’s Raman spectrum.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Cheung%2C+Sin+Hang%22">Cheung, Sin Hang</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Schmidt%2C+Kathrin%22">Schmidt, Kathrin</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Baribeau%2C+Jean-Marc%22">Baribeau, Jean-Marc</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lockwood%2C+David+J%2E%22">Lockwood, David J.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22O%27Leary%2C+Stephen+K%2E%22">O’Leary, Stephen K.</searchLink><relatesTo>1</relatesTo>, <i>stephen.oleary@ubc.ca</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; May2024, Vol. 35 Issue 13, p1-18, 18p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=177097871
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s10854-024-12616-2
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 18
        StartPage: 1
    Titles:
      – TitleFull: A re-examination of thin-film silicon’s Raman spectrum.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Cheung, Sin Hang
      – PersonEntity:
          Name:
            NameFull: Schmidt, Kathrin
      – PersonEntity:
          Name:
            NameFull: Baribeau, Jean-Marc
      – PersonEntity:
          Name:
            NameFull: Lockwood, David J.
      – PersonEntity:
          Name:
            NameFull: O’Leary, Stephen K.
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 05
              Text: May2024
              Type: published
              Y: 2024
          Identifiers:
            – Type: issn-print
              Value: 09574522
          Numbering:
            – Type: volume
              Value: 35
            – Type: issue
              Value: 13
          Titles:
            – TitleFull: Journal of Materials Science: Materials in Electronics
              Type: main
ResultId 1