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On-the-fly image-level oversampling for imbalanced datasets of manufacturing defects.

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Title: On-the-fly image-level oversampling for imbalanced datasets of manufacturing defects.
Authors: Theodoropoulos, Spyros1,2, stheodoropoulos@mail.ntua.gr, Zajec, Patrik3, Rožanec, Jože M.3, Kyriazis, Dimosthenis2, Tsanakas, Panayiotis1
Source: Machine Learning; Jul2024, Vol. 113 Issue 7, p4013-4035, 23p
Database: Applied Science & Technology Source
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  Data: <searchLink fieldCode="AU" term="%22Theodoropoulos%2C+Spyros%22">Theodoropoulos, Spyros</searchLink><relatesTo>1,2</relatesTo>, <i>stheodoropoulos@mail.ntua.gr</i><br /><searchLink fieldCode="AU" term="%22Zajec%2C+Patrik%22">Zajec, Patrik</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Rožanec%2C+Jože+M%2E%22">Rožanec, Jože M.</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Kyriazis%2C+Dimosthenis%22">Kyriazis, Dimosthenis</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Tsanakas%2C+Panayiotis%22">Tsanakas, Panayiotis</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Machine+Learning%22">Machine Learning</searchLink>; Jul2024, Vol. 113 Issue 7, p4013-4035, 23p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=177598360
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        Value: 10.1007/s10994-023-06498-4
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      – Code: eng
        Text: English
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              Text: Jul2024
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              Y: 2024
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