APA (7th ed.) Citation

Coskun, M., Polat, O., Orak, I., Coskun, F. M., Yildirim, Y., Sobola, D., . . . Turut, A. (2024). The electrical and dielectric features of Al/YbFeO3/p-Si/Al and Al/YbFe0.90Co0.10O3/p-Si/Al structures with interfacial perovskite-oxide layer depending on bias voltage and frequency. Journal of Materials Science: Materials in Electronics, 35(17), 1. https://doi.org/10.1007/s10854-024-12896-8

Chicago Style (17th ed.) Citation

Coskun, M., et al. "The Electrical and Dielectric Features of Al/YbFeO3/p-Si/Al and Al/YbFe0.90Co0.10O3/p-Si/Al Structures with Interfacial Perovskite-oxide Layer Depending on Bias Voltage and Frequency." Journal of Materials Science: Materials in Electronics 35, no. 17 (2024): 1. https://doi.org/10.1007/s10854-024-12896-8.

MLA (9th ed.) Citation

Coskun, M., et al. "The Electrical and Dielectric Features of Al/YbFeO3/p-Si/Al and Al/YbFe0.90Co0.10O3/p-Si/Al Structures with Interfacial Perovskite-oxide Layer Depending on Bias Voltage and Frequency." Journal of Materials Science: Materials in Electronics, vol. 35, no. 17, 2024, p. 1, https://doi.org/10.1007/s10854-024-12896-8.