The electrical and dielectric features of Al/YbFeO3/p-Si/Al and Al/YbFe0.90Co0.10O3/p-Si/Al structures with interfacial perovskite-oxide layer depending on bias voltage and frequency.
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| Title: | The electrical and dielectric features of Al/YbFeO3/p-Si/Al and Al/YbFe0.90Co0.10O3/p-Si/Al structures with interfacial perovskite-oxide layer depending on bias voltage and frequency. |
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| Authors: | Coskun, M.1,2, mustafa.coskun@medeniyet.edu.tr, Polat, O.3,4, ozgurpolat7@gmail.com, Orak, I.5, Coskun, F. M.1,2, Yildirim, Y.6, Sobola, D.3,7, Sen, C.8, Durmus, Z.9, Caglar, Y.10, Caglar, M.10, Turut, A.1,2 |
| Source: | Journal of Materials Science: Materials in Electronics; Jun2024, Vol. 35 Issue 17, p1-18, 18p |
| Database: | Applied Science & Technology Source |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 177921264 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: The electrical and dielectric features of Al/YbFeO3/p-Si/Al and Al/YbFe0.90Co0.10O3/p-Si/Al structures with interfacial perovskite-oxide layer depending on bias voltage and frequency. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Coskun%2C+M%2E%22">Coskun, M.</searchLink><relatesTo>1,2</relatesTo>, <i>mustafa.coskun@medeniyet.edu.tr</i><br /><searchLink fieldCode="AU" term="%22Polat%2C+O%2E%22">Polat, O.</searchLink><relatesTo>3,4</relatesTo>, <i>ozgurpolat7@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Orak%2C+I%2E%22">Orak, I.</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Coskun%2C+F%2E+M%2E%22">Coskun, F. M.</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Yildirim%2C+Y%2E%22">Yildirim, Y.</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Sobola%2C+D%2E%22">Sobola, D.</searchLink><relatesTo>3,7</relatesTo><br /><searchLink fieldCode="AU" term="%22Sen%2C+C%2E%22">Sen, C.</searchLink><relatesTo>8</relatesTo><br /><searchLink fieldCode="AU" term="%22Durmus%2C+Z%2E%22">Durmus, Z.</searchLink><relatesTo>9</relatesTo><br /><searchLink fieldCode="AU" term="%22Caglar%2C+Y%2E%22">Caglar, Y.</searchLink><relatesTo>10</relatesTo><br /><searchLink fieldCode="AU" term="%22Caglar%2C+M%2E%22">Caglar, M.</searchLink><relatesTo>10</relatesTo><br /><searchLink fieldCode="AU" term="%22Turut%2C+A%2E%22">Turut, A.</searchLink><relatesTo>1,2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Materials+Science%3A+Materials+in+Electronics%22">Journal of Materials Science: Materials in Electronics</searchLink>; Jun2024, Vol. 35 Issue 17, p1-18, 18p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=177921264 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10854-024-12896-8 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 18 StartPage: 1 Titles: – TitleFull: The electrical and dielectric features of Al/YbFeO3/p-Si/Al and Al/YbFe0.90Co0.10O3/p-Si/Al structures with interfacial perovskite-oxide layer depending on bias voltage and frequency. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Coskun, M. – PersonEntity: Name: NameFull: Polat, O. – PersonEntity: Name: NameFull: Orak, I. – PersonEntity: Name: NameFull: Coskun, F. M. – PersonEntity: Name: NameFull: Yildirim, Y. – PersonEntity: Name: NameFull: Sobola, D. – PersonEntity: Name: NameFull: Sen, C. – PersonEntity: Name: NameFull: Durmus, Z. – PersonEntity: Name: NameFull: Caglar, Y. – PersonEntity: Name: NameFull: Caglar, M. – PersonEntity: Name: NameFull: Turut, A. IsPartOfRelationships: – BibEntity: Dates: – D: 11 M: 06 Text: Jun2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 09574522 Numbering: – Type: volume Value: 35 – Type: issue Value: 17 Titles: – TitleFull: Journal of Materials Science: Materials in Electronics Type: main |
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