APA (7th ed.) Citation

Xue, Y., Hou, X., Zeng, Q., Yu, F., Liao, C., Li, J., . . . Li, Y. (2024). Preparation and characterization of solution deposition planarized Y2O3–Al2O3 compound seed layer for coated conductors. Journal of Materials Science: Materials in Electronics, 35(18), 1. https://doi.org/10.1007/s10854-024-12827-7

Chicago Style (17th ed.) Citation

Xue, Yan, Xin Hou, Qiming Zeng, Fei Yu, Chang Liao, Ji Li, Baolei Wang, Zhenjun Qin, and Yinxiang Li. "Preparation and Characterization of Solution Deposition Planarized Y2O3–Al2O3 Compound Seed Layer for Coated Conductors." Journal of Materials Science: Materials in Electronics 35, no. 18 (2024): 1. https://doi.org/10.1007/s10854-024-12827-7.

MLA (9th ed.) Citation

Xue, Yan, et al. "Preparation and Characterization of Solution Deposition Planarized Y2O3–Al2O3 Compound Seed Layer for Coated Conductors." Journal of Materials Science: Materials in Electronics, vol. 35, no. 18, 2024, p. 1, https://doi.org/10.1007/s10854-024-12827-7.