APA (7th ed.) Citation

Thakur, M., Singh, C., Jotania, R. B., Naqvi, S. T. A., & Srivastava, A. K. (2024). Frequency and Morphology Modulated Electrical, Dielectric, and Relaxation Metrics in Sol–Gel-Synthesized Sr Co1.5zLa0.5zFe12-2zO19 Hexaferrite: Corroboration with Impedance Spectroscopy Software. Journal of Electronic Materials, 53(8), 4682. https://doi.org/10.1007/s11664-024-11195-6

Chicago Style (17th ed.) Citation

Thakur, Manisha, Charanjeet Singh, R. B. Jotania, Sayed Tathir Abbas Naqvi, and A. K. Srivastava. "Frequency and Morphology Modulated Electrical, Dielectric, and Relaxation Metrics in Sol–Gel-Synthesized Sr Co1.5zLa0.5zFe12-2zO19 Hexaferrite: Corroboration with Impedance Spectroscopy Software." Journal of Electronic Materials 53, no. 8 (2024): 4682. https://doi.org/10.1007/s11664-024-11195-6.

MLA (9th ed.) Citation

Thakur, Manisha, et al. "Frequency and Morphology Modulated Electrical, Dielectric, and Relaxation Metrics in Sol–Gel-Synthesized Sr Co1.5zLa0.5zFe12-2zO19 Hexaferrite: Corroboration with Impedance Spectroscopy Software." Journal of Electronic Materials, vol. 53, no. 8, 2024, p. 4682, https://doi.org/10.1007/s11664-024-11195-6.