APA (7th ed.) Citation

Toprak, B. Ç., Efkere, H. İ., Aydın, S. Ş., Tataroğlu, A., & Özçelik, S. (2024). Structural, morphological, optical and electrical characterization of MgO thin films grown by sputtering technique on different substrates. Journal of Materials Science: Materials in Electronics, 35(20), 1. https://doi.org/10.1007/s10854-024-13116-z

Chicago Style (17th ed.) Citation

Toprak, Başak Çağlayan, Halil İbrahim Efkere, Saime Şebnem Aydın, Adem Tataroğlu, and Süleyman Özçelik. "Structural, Morphological, Optical and Electrical Characterization of MgO Thin Films Grown by Sputtering Technique on Different Substrates." Journal of Materials Science: Materials in Electronics 35, no. 20 (2024): 1. https://doi.org/10.1007/s10854-024-13116-z.

MLA (9th ed.) Citation

Toprak, Başak Çağlayan, et al. "Structural, Morphological, Optical and Electrical Characterization of MgO Thin Films Grown by Sputtering Technique on Different Substrates." Journal of Materials Science: Materials in Electronics, vol. 35, no. 20, 2024, p. 1, https://doi.org/10.1007/s10854-024-13116-z.

Warning: These citations may not always be 100% accurate.