Accurate Estimation of Data Retention Voltage (DRV) for a 6T SRAM Cell at 45 nm, 65 nm, and 130 nm Technology Nodes.
Saved in:
| Title: | Accurate Estimation of Data Retention Voltage (DRV) for a 6T SRAM Cell at 45 nm, 65 nm, and 130 nm Technology Nodes. |
|---|---|
| Authors: | Gupta, Ruchi1, ku.mittal@gmail.com, Goyal, Mohit2, mohitgoyal1000@gmail.com, Dasgupta, S.3, sudebfec@iitr.ac.in |
| Source: | IETE Journal of Research; Apr2024, Vol. 70 Issue 4, p4025-4036, 12p |
| Database: | Applied Science & Technology Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 03772063 |
|---|---|
| DOI: | 10.1080/03772063.2023.2198991 |
