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Characterizing 1550 nm optical components down to 8 K.

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Title: Characterizing 1550 nm optical components down to 8 K.
Authors: Kuhlbusch, Tim J.1, kuhlbusch@physik.rwth-aachen.de, Zeoli, Morgane1,2,3, Joppe, Robert1, Collette, Christophe3, Hebbeker, Thomas1, van Heijningen, Joris V.2,4,5, Stahl, Achim1
Source: Cryogenics; Sep2024, Vol. 142, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 179274730
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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        Value: 10.1016/j.cryogenics.2024.103895
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      – Code: eng
        Text: English
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      – TitleFull: Characterizing 1550 nm optical components down to 8 K.
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              Text: Sep2024
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