APA (7th ed.) Citation

Liu, S., & Wu, C. (2024). An efficient partial sampling inspection for lot sentencing based on process yield. Annals of Operations Research, 340(1), 325. https://doi.org/10.1007/s10479-023-05341-2

Chicago Style (17th ed.) Citation

Liu, Shih-Wen, and Chien-Wei Wu. "An Efficient Partial Sampling Inspection for Lot Sentencing Based on Process Yield." Annals of Operations Research 340, no. 1 (2024): 325. https://doi.org/10.1007/s10479-023-05341-2.

MLA (9th ed.) Citation

Liu, Shih-Wen, and Chien-Wei Wu. "An Efficient Partial Sampling Inspection for Lot Sentencing Based on Process Yield." Annals of Operations Research, vol. 340, no. 1, 2024, p. 325, https://doi.org/10.1007/s10479-023-05341-2.