An efficient partial sampling inspection for lot sentencing based on process yield.
Saved in:
| Title: | An efficient partial sampling inspection for lot sentencing based on process yield. |
|---|---|
| Authors: | Liu, Shih-Wen1, Wu, Chien-Wei2, cweiwu@ie.nthu.edu.tw |
| Source: | Annals of Operations Research; Sep2024, Vol. 340 Issue 1, p325-344, 20p |
| Database: | Applied Science & Technology Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
Be the first to leave a comment!
