Extended Caking Method for Strain Analysis of Polycrystalline Diffraction Debye–Scherrer Rings.

Saved in:
Bibliographic Details
Title: Extended Caking Method for Strain Analysis of Polycrystalline Diffraction Debye–Scherrer Rings.
Authors: Uzun, Fatih1, fatihuzun@me.com, Daisenberger, Dominik2, Liogas, Konstantinos1, Wang, Zifan Ivan3, Chen, Jingwei1, Besnard, Cyril1, Korsunsky, Alexander M.1
Source: Crystals (2073-4352); Aug2024, Vol. 14 Issue 8, p716, 14p
Database: Applied Science & Technology Source
Full text is not displayed to guests.
Description
ISSN:20734352
DOI:10.3390/cryst14080716