Joint Interface Microstructure Analysis of Gallium-based Thermal Interface Material During Reflow.
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| Title: | Joint Interface Microstructure Analysis of Gallium-based Thermal Interface Material During Reflow. |
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| Authors: | Lin, Bo-Yi1, Lin, Ting-Chun2, Kao, Chin-Li2, Hsiao, Shih-Chieh1, Tseng, Pei-Hsuan1, Kuo, Jui-Chao1, jckuo@mail.ncku.edu.tw |
| Source: | Journal of Electronic Materials; Oct2024, Vol. 53 Issue 10, p6471-6481, 11p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 179439553 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Joint Interface Microstructure Analysis of Gallium-based Thermal Interface Material During Reflow. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Lin%2C+Bo-Yi%22">Lin, Bo-Yi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lin%2C+Ting-Chun%22">Lin, Ting-Chun</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Kao%2C+Chin-Li%22">Kao, Chin-Li</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Hsiao%2C+Shih-Chieh%22">Hsiao, Shih-Chieh</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Tseng%2C+Pei-Hsuan%22">Tseng, Pei-Hsuan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kuo%2C+Jui-Chao%22">Kuo, Jui-Chao</searchLink><relatesTo>1</relatesTo>, <i>jckuo@mail.ncku.edu.tw</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Oct2024, Vol. 53 Issue 10, p6471-6481, 11p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=179439553 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11664-024-11360-x Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 6471 Titles: – TitleFull: Joint Interface Microstructure Analysis of Gallium-based Thermal Interface Material During Reflow. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Lin, Bo-Yi – PersonEntity: Name: NameFull: Lin, Ting-Chun – PersonEntity: Name: NameFull: Kao, Chin-Li – PersonEntity: Name: NameFull: Hsiao, Shih-Chieh – PersonEntity: Name: NameFull: Tseng, Pei-Hsuan – PersonEntity: Name: NameFull: Kuo, Jui-Chao IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Text: Oct2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 03615235 Numbering: – Type: volume Value: 53 – Type: issue Value: 10 Titles: – TitleFull: Journal of Electronic Materials Type: main |
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