APA (7th ed.) Citation

Shender, I. O., Pogodin, A. I., Filep, M. J., Malakhovska, T. O., Kokhan, O. P., Bilanych, V. S., . . . Izai, V. Y. (2024). Microhardness of single-crystal samples of Ag7+x(P1-xGex)S6 solid solutions. Semiconductor Physics, Quantum Electronics & Optoelectronics, 27(2), 169. https://doi.org/10.15407/spqeo27.02.169

Chicago Style (17th ed.) Citation

Shender, I. O., A. I. Pogodin, M. J. Filep, T. O. Malakhovska, O. P. Kokhan, V. S. Bilanych, T. Ya Babuka, and V. Yu Izai. "Microhardness of Single-crystal Samples of Ag7+x(P1-xGex)S6 Solid Solutions." Semiconductor Physics, Quantum Electronics & Optoelectronics 27, no. 2 (2024): 169. https://doi.org/10.15407/spqeo27.02.169.

MLA (9th ed.) Citation

Shender, I. O., et al. "Microhardness of Single-crystal Samples of Ag7+x(P1-xGex)S6 Solid Solutions." Semiconductor Physics, Quantum Electronics & Optoelectronics, vol. 27, no. 2, 2024, p. 169, https://doi.org/10.15407/spqeo27.02.169.