Simulation Study and Reliability Analysis of Low Actuation Voltage Cantilever Based RF MEMS Switch.
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| Title: | Simulation Study and Reliability Analysis of Low Actuation Voltage Cantilever Based RF MEMS Switch. |
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| Authors: | Huddar, Shivashankar A.1, shivashankar.a.huddar@gmail.com, Sheeparmatti, B. G.2, Patil, A. Y.3, physicssiddu@kleit.ac.in, Iyer, Nalini C.1, Kumar, Raman4, Mathad, Shridhar N.5 |
| Source: | Journal of Nano- & Electronic Physics; 2024, Vol. 16 Issue 6, p1-5, 5p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 182032961 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=182032961 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.21272/jnep.16(6).06018 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 1 Titles: – TitleFull: Simulation Study and Reliability Analysis of Low Actuation Voltage Cantilever Based RF MEMS Switch. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Huddar, Shivashankar A. – PersonEntity: Name: NameFull: Sheeparmatti, B. G. – PersonEntity: Name: NameFull: Patil, A. Y. – PersonEntity: Name: NameFull: Iyer, Nalini C. – PersonEntity: Name: NameFull: Kumar, Raman – PersonEntity: Name: NameFull: Mathad, Shridhar N. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 12 Text: 2024 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 20776772 Numbering: – Type: volume Value: 16 – Type: issue Value: 6 Titles: – TitleFull: Journal of Nano- & Electronic Physics Type: main |
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