Analysis of leaching chemicals from solder mask and effect on electroless Ni(P) plating.
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| Title: | Analysis of leaching chemicals from solder mask and effect on electroless Ni(P) plating. |
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| Authors: | Yu, Zhong-Yen1, Wu, Chen-Yu1, Fu, Kuan-Lin1, Chang, Jui-Sheng1, Yen, Tzu-Hsuan1, Tsai, Chieh-Pu1, Hsu, Ya-Hui1, Lee, Yun-Fong1, Liu, Cheng-Yi1, chengyiliuoem@gmail.com |
| Source: | Journal of Materials Science: Materials in Electronics; Jan2025, Vol. 36 Issue 1, p1-11, 11p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 182089383 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=182089383 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s10854-024-14149-0 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 1 Titles: – TitleFull: Analysis of leaching chemicals from solder mask and effect on electroless Ni(P) plating. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Yu, Zhong-Yen – PersonEntity: Name: NameFull: Wu, Chen-Yu – PersonEntity: Name: NameFull: Fu, Kuan-Lin – PersonEntity: Name: NameFull: Chang, Jui-Sheng – PersonEntity: Name: NameFull: Yen, Tzu-Hsuan – PersonEntity: Name: NameFull: Tsai, Chieh-Pu – PersonEntity: Name: NameFull: Hsu, Ya-Hui – PersonEntity: Name: NameFull: Lee, Yun-Fong – PersonEntity: Name: NameFull: Liu, Cheng-Yi IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 01 Text: Jan2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 09574522 Numbering: – Type: volume Value: 36 – Type: issue Value: 1 Titles: – TitleFull: Journal of Materials Science: Materials in Electronics Type: main |
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