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Ultra-fast single-crystal CVD diamonds in the particle time-of-flight (PTOF) detector for low yield burn-history measurements on the NIF (invited).

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Title: Ultra-fast single-crystal CVD diamonds in the particle time-of-flight (PTOF) detector for low yield burn-history measurements on the NIF (invited).
Authors: Reichelt, B. L.1, blr@mit.edu, Kishimori, R.1, Lawrence, Y.1, Wink, C. W.1, Johnson, M. Gatu1, Johnson, T. M.1, Adrian, P. J.2, Baker, K. L.3, Casey, D. T.3, Clark, D. S.3, Dannhoff, S. G.1, Eckart, M. J.3, Evans, T. E.1, Geppert-Kleinrath, H.2, Gibson, D.3, Hahn, K. D.3, Higginson, D. P.3, Izumi, N.3, Kabadi, N. V.4, Kerr, S.3
Source: Review of Scientific Instruments; Jan2025, Vol. 96 Issue 1, p1-10, 10p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 182617839
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; Jan2025, Vol. 96 Issue 1, p1-10, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=182617839
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              Text: Jan2025
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