Predicting test failures induced by software defects: A lightweight alternative to software defect prediction and its industrial application.
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| Title: | Predicting test failures induced by software defects: A lightweight alternative to software defect prediction and its industrial application. |
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| Authors: | Madeyski, Lech1, lech.madeyski@pwr.edu.pl, Stradowski, Szymon1,2 |
| Source: | Journal of Systems & Software; May2025, Vol. 223, pN.PAG-N.PAG, 1p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 183209844 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=183209844 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1016/j.jss.2025.112360 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 1 StartPage: N.PAG Titles: – TitleFull: Predicting test failures induced by software defects: A lightweight alternative to software defect prediction and its industrial application. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Madeyski, Lech – PersonEntity: Name: NameFull: Stradowski, Szymon IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2025 Type: published Y: 2025 Identifiers: – Type: issn-print Value: 01641212 Numbering: – Type: volume Value: 223 Titles: – TitleFull: Journal of Systems & Software Type: main |
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