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Bayesian inference for multi-label classification for root cause analysis and probe card maintenance decision support and an empirical study.

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Bibliographic Details
Title: Bayesian inference for multi-label classification for root cause analysis and probe card maintenance decision support and an empirical study.
Authors: Chien, Chen-Fu1,2,3, cfchien@mx.nthu.edu.tw, Peng, Jia-Yu1
Source: Journal of Intelligent Manufacturing; Mar2025, Vol. 36 Issue 3, p1943-1958, 16p
Database: Applied Science & Technology Source
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Description
ISSN:09565515
DOI:10.1007/s10845-024-02336-z